2005 Photomicrography Competition

Moth wing scales

Zdenka Jenikova

Affiliation
Czech Technical University
Prague, Czech Republic
Technique
Episcopic polarized light and darkfield
Magnification
200x

Crystallized nickel nitrate and resorcinol

Edy Kieser

Location
Ennenda, Switzerland
Technique
Polarized Light
Magnification
45x