1985 Photomicrography Competition

Electronically enhanced charge coupled device image of a buried N-channel MOS-FET configured as a source follower driven into avalanche condition, demonstrating near infrared luminescence

Charles V. Davis

Affiliation
NASA Jet Propulsion Laboratory
California Institute of Technology
Pasadena, California, USA
Technique
Brightfield
Magnification
100x

Stainless steel exposed to simulated coal gas corrosion

Richard H. Lee

Affiliation
Argonne National Laboratory
Argonne, Illinois, USA
Technique
Differential Interference Contrast
Magnification
28x

Niobium explosively bonded to copper

Edward E. Keppler

Affiliation
Argonne National Laboratory
Argonne, Illinois, USA
Technique
Brightfield
Magnification
50x